In today’s fast-paced scientific and industrial environments, precision and efficiency are paramount. Our Automated Thickness Mapping Systems are designed to meet these demands, offering fully-automatic mapping of thickness and index for nearly any sample shape. Whether you’re working with wafers, films, or any other materials, our advanced technology ensures accurate and reliable measurements every time.
Automated Thickness Mapping Systems are sophisticated devices used to measure the thickness of thin films and coatings across substrates. These systems are essential for industries where uniformity and precision of film thickness are crucial, such as semiconductor manufacturing, solar cells, and optical coatings. Filmetrics’ solutions stand out due to their advanced technology, user-friendly interfaces, and exceptional accuracy.
At TNC, we are dedicated to providing you with the highest quality products in the field of thickness measurement. Our extensive range of advanced thickness measurement tools and equipment are designed to meet the precise needs of various industries. Whether you’re in manufacturing, research, or quality control, our products ensure accurate and reliable measurements, enhancing your operational efficiency and product quality.
Choose what you want
Thickness Measurement Products
Versatility: Capable of handling a wide range of sample shapes and sizes, from small wafers to large, irregularly shaped samples.
Precision: High resolution measurements that guarantee the utmost accuracy, critical for research and quality control.
Automation: Fully-automatic operation reduces the need for manual intervention, saving time and minimizing the potential for human error.
User-Friendly Interface: Intuitive software interface that makes setup and operation straightforward, even for those new to the technology.
Comprehensive Data Analysis: Advanced algorithms provide detailed thickness and index mapping, offering a comprehensive view of your sample’s properties.
Semiconductor Manufacturing: Precise thickness measurements are crucial for the production of semiconductor wafers, ensuring consistent quality and performance.
Optical Coatings: Accurate mapping of thin film thickness and refractive index is essential for developing high-performance optical coatings.
Material Science Research: Researchers can benefit from detailed thickness and index data to better understand material properties and behaviors.
Quality Control: Automated systems provide consistent and reliable measurements, essential for maintaining high standards in manufacturing processes.
Choosing our Automated Thickness Mapping Systems means investing in cutting-edge technology that enhances your capabilities and improves your workflow. Our systems are designed with the end-user in mind, offering unparalleled precision, ease of use, and versatility. Whether you are in academia, industry, or research, our solutions are tailored to meet your specific needs and drive your success.
Explore the future of precision measurement with our Automated Thickness Mapping Systems. Contact us today to learn more and see how our technology can benefit your operations.
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